Work out electromigration lifetime instantly with clear inputs, formula shown and shareable results.
Black's equation makes median time to failure proportional to J^-n times exp(Ea/kT), with n about 2 for copper. Both terms bite hard: doubling current density quarters life, and every 10 degrees of temperature rise costs roughly a third of it at Ea = 0.9 eV.
Black's equation
MTF = A x J^-n x exp(Ea / kT), n approx 2, Ea approx 0.7-1.0 eV for copper
Wire cross-sections shrink faster than currents fall, so current density rises with each node, and copper grain boundaries and liner thickness make it worse.
Current density rules per metal layer, wider wires or multiple parallel wires on high-current nets, and via arrays instead of single vias.