Work out burn in time instantly with clear inputs, formula shown and shareable results.
Burn-in compresses field time by raising temperature: the Arrhenius acceleration factor at 125 versus 55 degrees with Ea = 0.7 eV is around 30, so 2,000 field hours are screened in about 65 hours. Voltage stress multiplies that further, which is why modern screens combine both.
Burn-in
AF = exp((Ea/k)(1/T_use - 1/T_burn)); burn-in hours = target field hours / AF
To remove infant mortality failures before shipment. The bathtub curve's early steep region is where most latent defects surface.
It is expensive, consumes some device life, and modern process control has cut infant mortality enough that statistical screening plus IDDQ and stress testing often suffices.