Work out test time and cost instantly with clear inputs, formula shown and shareable results.
Test cost per die is ATE hourly rate divided by throughput, where throughput comes from test plus index time divided by the number of parallel sites. Multi-site testing is the main lever: going from 1 to 8 sites cuts cost per die by nearly eight.
Test cost
effective time = (test + index) / sites; cost per die = ATE rate / (3600 / effective time)
On short tests it can dominate. A 0.4 s index on a 0.5 s test wastes 44% of the tester, so handler speed becomes the constraint.
Tester resources — channels, power supplies, digital instruments — and handler capability. Analogue and RF tests parallelise far less easily than digital scan.